SIMS proceedings paper
Neutral cesium deposition prior to SIMS depth profiling - preliminary results on organic samples
Version of Record online: 8 MAY 2012
Copyright © 2012 John Wiley & Sons, Ltd.
Surface and Interface Analysis
Special Issue: Proceedings of the Eighteenth International Conference on Secondary Ion Mass Spectrometry, SIMS XVIII, Riva Del Garda, Trento, Italy, September 18 - 23, 2011
Volume 45, Issue 1, pages 57–60, January 2013
How to Cite
Bendler, B., Philipp, P. and Wirtz, T. (2013), Neutral cesium deposition prior to SIMS depth profiling - preliminary results on organic samples. Surf. Interface Anal., 45: 57–60. doi: 10.1002/sia.5016
- Issue online: 18 DEC 2012
- Version of Record online: 8 MAY 2012
- Manuscript Revised: 22 MAR 2012
- Manuscript Accepted: 22 MAR 2012
- Manuscript Received: 28 SEP 2011
- Fonds National de la Recherche Luxembourg
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