SIMS proceedings paper
Organic ion yield enhancement in secondary ion mass spectrometry using water vapour injection
Article first published online: 15 MAY 2012
Copyright © 2012 John Wiley & Sons, Ltd.
Surface and Interface Analysis
Special Issue: Proceedings of the Eighteenth International Conference on Secondary Ion Mass Spectrometry, SIMS XVIII, Riva Del Garda, Trento, Italy, September 18 - 23, 2011
Volume 45, Issue 1, pages 46–49, January 2013
How to Cite
Mouhib, T., Delcorte, A., Poleunis, C. and Bertrand, P. (2013), Organic ion yield enhancement in secondary ion mass spectrometry using water vapour injection. Surf. Interface Anal., 45: 46–49. doi: 10.1002/sia.5043
- Issue published online: 18 DEC 2012
- Article first published online: 15 MAY 2012
- Manuscript Accepted: 20 APR 2012
- Manuscript Revised: 13 APR 2012
- Manuscript Received: 3 OCT 2011
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