SIMS proceedings paper
Characterization of microphase-separated diblock copolymer films by TOF-SIMS
Article first published online: 20 JUN 2012
Copyright © 2012 John Wiley & Sons, Ltd.
Surface and Interface Analysis
Special Issue: Proceedings of the Eighteenth International Conference on Secondary Ion Mass Spectrometry, SIMS XVIII, Riva Del Garda, Trento, Italy, September 18 - 23, 2011
Volume 45, Issue 1, pages 498–502, January 2013
How to Cite
Lee, J., Kang, M. H., Lim, W. C., Shin, K. and Lee, Y. (2013), Characterization of microphase-separated diblock copolymer films by TOF-SIMS. Surf. Interface Anal., 45: 498–502. doi: 10.1002/sia.5074
- Issue published online: 18 DEC 2012
- Article first published online: 20 JUN 2012
- Manuscript Accepted: 24 MAY 2012
- Manuscript Revised: 13 MAY 2012
- Manuscript Received: 28 SEP 2011
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