SIMS proceedings paper
Ionization potential and ion yield of CsM clusters sputtered from Si
Article first published online: 19 JUN 2012
Copyright © 2012 John Wiley & Sons, Ltd.
Surface and Interface Analysis
Special Issue: Proceedings of the Eighteenth International Conference on Secondary Ion Mass Spectrometry, SIMS XVIII, Riva Del Garda, Trento, Italy, September 18 - 23, 2011
Volume 45, Issue 1, pages 103–106, January 2013
How to Cite
Kudriavtsev, Yu., Asomoza, R., Mansurova, M. and Perez, L. A. (2013), Ionization potential and ion yield of CsM clusters sputtered from Si. Surf. Interface Anal., 45: 103–106. doi: 10.1002/sia.5083
- Issue published online: 18 DEC 2012
- Article first published online: 19 JUN 2012
- Manuscript Accepted: 29 MAY 2012
- Manuscript Revised: 3 APR 2012
- Manuscript Received: 8 OCT 2011
- Conacyt. Grant Number: 79812
- DGAPA-UNAM. Grant Number: IN102511
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