SIMS proceedings paper
Measurement of energy spectra on irradiated polycrystalline UO2 samples using secondary ion mass spectrometry
Article first published online: 20 JUL 2012
Copyright © 2012 John Wiley & Sons, Ltd.
Surface and Interface Analysis
Special Issue: Proceedings of the Eighteenth International Conference on Secondary Ion Mass Spectrometry, SIMS XVIII, Riva Del Garda, Trento, Italy, September 18 - 23, 2011
Volume 45, Issue 1, pages 427–429, January 2013
How to Cite
Roure, I., Pasquet, B., Desgranges, L. and Bienvenu, Ph. (2013), Measurement of energy spectra on irradiated polycrystalline UO2 samples using secondary ion mass spectrometry. Surf. Interface Anal., 45: 427–429. doi: 10.1002/sia.5115
- Issue published online: 18 DEC 2012
- Article first published online: 20 JUL 2012
- Manuscript Revised: 19 JUN 2012
- Manuscript Accepted: 19 JUN 2012
- Manuscript Received: 11 OCT 2011
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