SIMS proceedings paper
Correction of topographic artefacts of ToF-SIMS element distributions
Article first published online: 31 JUL 2012
Copyright © 2012 John Wiley & Sons, Ltd.
Surface and Interface Analysis
Special Issue: Proceedings of the Eighteenth International Conference on Secondary Ion Mass Spectrometry, SIMS XVIII, Riva Del Garda, Trento, Italy, September 18 - 23, 2011
Volume 45, Issue 1, pages 457–460, January 2013
How to Cite
Ziegler, G. and Hutter, H. (2013), Correction of topographic artefacts of ToF-SIMS element distributions. Surf. Interface Anal., 45: 457–460. doi: 10.1002/sia.5127
- Issue published online: 18 DEC 2012
- Article first published online: 31 JUL 2012
- Manuscript Accepted: 22 JUN 2012
- Manuscript Revised: 31 MAY 2012
- Manuscript Received: 5 OCT 2011
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