Thickness dependence of the structural, mechanical and electrical properties of Ni films deposited on polyimide by ion beam-assisted deposition (IBAD)
Version of Record online: 3 AUG 2012
Copyright © 2012 John Wiley & Sons, Ltd.
Surface and Interface Analysis
Volume 45, Issue 3, pages 691–697, March 2013
How to Cite
Xu, J. and Shao, T. (2013), Thickness dependence of the structural, mechanical and electrical properties of Ni films deposited on polyimide by ion beam-assisted deposition (IBAD). Surf. Interface Anal., 45: 691–697. doi: 10.1002/sia.5131
- Issue online: 4 FEB 2013
- Version of Record online: 3 AUG 2012
- Manuscript Revised: 29 JUN 2012
- Manuscript Accepted: 29 JUN 2012
- Manuscript Received: 22 FEB 2012
- State Key Basic Research Program of China 973. Grant Number: 2012CB934101
- National Natural Science Foundation of China. Grant Number: 90923018
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