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Observation of self-assembled layers of alkyl phosphonic acid on aluminum using low-voltage scanning electron microscopy and AFM

Authors

  • H. Sato,

    1. Graduate School of Chemical Sciences and Engineering, Hokkaido University, Sapporo, Hokkaido, Japan
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  • T. Fujii,

    1. Division of Materials Chemisty, Faculty of Engineering, Hokkaido University, Sapporo, Hokkaido, Japan
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  • E. Tsuji,

    1. Graduate School of Chemical Sciences and Engineering, Hokkaido University, Sapporo, Hokkaido, Japan
    2. Division of Materials Chemisty, Faculty of Engineering, Hokkaido University, Sapporo, Hokkaido, Japan
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  • Y. Aoki,

    1. Graduate School of Chemical Sciences and Engineering, Hokkaido University, Sapporo, Hokkaido, Japan
    2. Division of Materials Chemisty, Faculty of Engineering, Hokkaido University, Sapporo, Hokkaido, Japan
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  • K. Shimizu,

    1. i-SEM Laboratory, Sagamihara Incubation Center, Sagamihara, Japan
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  • P. Skeldon,

    1. Corrosion and Protection Centre, School of Materials, The University of Manchester, Manchester, United Kingdom
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  • G.E. Thompson,

    1. Corrosion and Protection Centre, School of Materials, The University of Manchester, Manchester, United Kingdom
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  • H. Habazaki

    Corresponding author
    1. Division of Materials Chemisty, Faculty of Engineering, Hokkaido University, Sapporo, Hokkaido, Japan
    2. Frontier Chemistry Center, Faculty of Engineering, Hokkaido University, Sapporo, Hokkaido, Japan
    • Graduate School of Chemical Sciences and Engineering, Hokkaido University, Sapporo, Hokkaido, Japan
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Correspondence to: H. Habazaki, Faculty of Engineering, Hokkaido University, Sapporo, Hokkaido 060-8628, Japan

E-mail: habazaki@eng.hokudai.ac.jp

Abstract

Self-assembled alkyl phosphate layers have been formed on a flat, anodized aluminum substrate in dilute ethanol solution containing 2 wt% n-tetradecylphosphonic acid (TDP) and examined by low-voltage scanning electron microscopy as well as atomic force microscopy and X-ray photoelectron spectroscopy. Locally, multi-layered alkyl phosphate films have been formed on aluminum, being clearly observed by a low-voltage scanning electron microscope operated at less than 1 kV. Atomic force microscopy observations disclosed that bilayers of tetradecylphosphonic acid are stacked on the substrate to form multilayers. The present study revealed that the uniform self-organized monolayer is not always formed readily on an oxidized aluminum surface. Copyright © 2013 John Wiley & Sons, Ltd.

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