SIMS proceedings paper
Application of pan-sharpening to SIMS imaging
Version of Record online: 24 JUN 2014
Copyright © 2014 John Wiley & Sons, Ltd.
Surface and Interface Analysis
Special Issue: Proceedings of the Nineteenth International Conference on Secondary Ion Mass Spectrometry, SIMS XIX, Jeju, Korea, September 29–October 4, 2013
Volume 46, Issue S1, pages 217–220, November 2014
How to Cite
2014) Application of pan-sharpening to SIMS imaging, Surf. Interface Anal., 46, pages 217–220, doi: 10.1002/sia.5540., , and (
- Issue online: 25 NOV 2014
- Version of Record online: 24 JUN 2014
- Manuscript Accepted: 7 APR 2014
- Manuscript Revised: 17 MAR 2014
- Manuscript Received: 26 NOV 2013
- Department of Energy. Grant Number: DE-FG-02-06ERER15803
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