SIMS proceedings paper
NanoSIMS imaging alteration layers of a leached SON68 glass via a FIB-made wedged crater
Version of Record online: 11 JUN 2014
Copyright © 2014 John Wiley & Sons, Ltd.
Surface and Interface Analysis
Special Issue: Proceedings of the Nineteenth International Conference on Secondary Ion Mass Spectrometry, SIMS XIX, Jeju, Korea, September 29–October 4, 2013
Volume 46, Issue S1, pages 233–237, November 2014
How to Cite
2014), NanoSIMS imaging alteration layers of a leached SON68 glass via a FIB-made wedged crater, Surf. Interface Anal., 46, pages 233–237, doi: 10.1002/sia.5585, , , , , , , and , (
- Issue online: 25 NOV 2014
- Version of Record online: 11 JUN 2014
- Manuscript Accepted: 7 MAY 2014
- Manuscript Revised: 4 MAY 2014
- Manuscript Received: 25 OCT 2013
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