Surface and Interface Analysis

Cover image for Vol. 43 Issue 1‐2

Special Issue: Proceedings of the Seventeenth International Conference on Secondary Ion Mass Spectrometry, SIMS XVII, Toronto, Ontario, Canada, September 14-18, 2009

January - February 2011

Volume 43, Issue 1-2

Pages 1–676

  1. Preface

    1. Top of page
    2. Preface
    3. Editorials
    4. SIMS Proceedings Papers
    5. Errata
    1. Preface for Proceedings of SIMS XVII, Toronto, 2009 (page 1)

      Joe Gardella and Paula Clark

      Version of Record online: 19 JAN 2011 | DOI: 10.1002/sia.3720

  2. Editorials

    1. Top of page
    2. Preface
    3. Editorials
    4. SIMS Proceedings Papers
    5. Errata
  3. SIMS Proceedings Papers

    1. Top of page
    2. Preface
    3. Editorials
    4. SIMS Proceedings Papers
    5. Errata
    1. Depth profiling by cluster projectiles as seen by computer simulations (pages 12–15)

      Z. Postawa, L. Rzeznik, R. Paruch, M. F. Russo, N. Winograd and B. J. Garrison

      Version of Record online: 11 MAY 2010 | DOI: 10.1002/sia.3417

    2. Sputtering soft materials with molecular projectiles: a microscopic view (pages 16–19)

      A. Delcorte, B. J. Garrison and K. Hamraoui

      Version of Record online: 11 MAY 2010 | DOI: 10.1002/sia.3405

    3. Investigations of secondary ion yield-enhancing methods in combination (pages 20–23)

      A. Heile, C. Muhmann, D. Lipinsky and H. F. Arlinghaus

      Version of Record online: 22 JUN 2010 | DOI: 10.1002/sia.3556

    4. Sputtered molecular fluoride anions: HfFn and WFn (pages 32–35)

      Hubert Gnaser and Robin Golser

      Version of Record online: 19 MAY 2010 | DOI: 10.1002/sia.3442

    5. The isotopic comparative method (ICM) for SIMS quantification of boron in silicon up to 40 at.% (pages 36–40)

      Christiane Dubois, Gilles Prudon, Jean-Claude Dupuy, Brice Gautier, Bruno Canut, Yann Le Gall and Thierry Kociniewski

      Version of Record online: 20 JUL 2010 | DOI: 10.1002/sia.3629

    6. Retrospective sputter depth profiling using 3D mass spectral imaging (pages 41–44)

      Leiliang Zheng, Andreas Wucher and Nicholas Winograd

      Version of Record online: 1 JUN 2010 | DOI: 10.1002/sia.3509

    7. Statistics of electron and ion emission from single massive cluster impacts (pages 49–52)

      S. V. Verkhoturov, M. J. Eller, S. Della-Negra, R. D. Rickman, J. E. Locklear and E. A. Schweikert

      Version of Record online: 22 JUN 2010 | DOI: 10.1002/sia.3568

    8. Photon emission from massive projectile impacts on solids (pages 53–57)

      F. A. Fernandez-Lima, V. T. Pinnick, S. Della-Negra and E. A. Schweikert

      Version of Record online: 22 JUN 2010 | DOI: 10.1002/sia.3592

    9. Massive clusters: Secondary emission from qkeV to qMeV. New emission processes? New SIMS probe? (pages 62–65)

      S. Della-Negra, J. Depauw, C. Guillermier and E. A. Schweikert

      Version of Record online: 27 MAY 2010 | DOI: 10.1002/sia.3416

    10. The Pegase project, a new solid surface probe: focused massive cluster ion beams (pages 66–69)

      S. Della-Negra, J. Arianer, J. Depauw, S. V. Verkhoturov and E. A. Schweikert

      Version of Record online: 22 JUN 2010 | DOI: 10.1002/sia.3478

    11. Analysis and fragmentation of organic samples by (low-energy) dynamic SIMS (pages 88–91)

      K. Q. Ngo, P. Philipp, Y. Jin, S. E. Morris, M. Shtein, J. Kieffer and T. Wirtz

      Version of Record online: 8 JUN 2010 | DOI: 10.1002/sia.3533

    12. Analysis of organic semiconductor multilayers with Ar cluster secondary ion mass spectrometry (pages 95–98)

      Satoshi Ninomiya, Kazuya Ichiki, Hideaki Yamada, Yoshihiko Nakata, Toshio Seki, Takaaki Aoki and Jiro Matsuo

      Version of Record online: 22 JUN 2010 | DOI: 10.1002/sia.3587

    13. A molecular dynamics study of a 5 keV C60 fullerene impact on a two-component organic molecular sample (pages 107–111)

      M. G. Ponomarev, B. J. Garrison, J. C. Vickerman and R. P. Webb

      Version of Record online: 22 JUN 2010 | DOI: 10.1002/sia.3527

    14. The effect of the H:C ratio on the sputtering of molecular solids by fullerenes (pages 116–119)

      Roger P. Webb, Barbara J. Garrison and John C. Vickerman

      Version of Record online: 1 JUN 2010 | DOI: 10.1002/sia.3421

    15. Surface morphology of PMMA surfaces bombarded with size-selected gas cluster ion beams (pages 120–122)

      K. Ichiki, S. Ninomiya, Y. Nakata, H. Yamada, T. Seki, T. Aoki and J. Matsuo

      Version of Record online: 11 MAY 2010 | DOI: 10.1002/sia.3444

    16. Effect of Si[BOND]C bond formation in 20 keV C60 bombardment of Si (pages 123–125)

      Kristin D. Krantzman and Barbara J. Garrison

      Version of Record online: 1 JUN 2010 | DOI: 10.1002/sia.3438

    17. Strategies for modeling diverse chemical reactions in molecular dynamics simulations of cluster bombardment (pages 126–128)

      Paul E. Kennedy, Barbara J. Garrison, Michael F. Russo and Adri C. T. van Duin

      Version of Record online: 27 MAY 2010 | DOI: 10.1002/sia.3485

    18. Isotopic comparative method (ICM) for the determination of variations of the ion yields in boron-doped silicon as a function of oxygen concentration in the 0–10 at.% range (pages 137–140)

      Jean-Claude Dupuy, Christiane Dubois, Gilles Prudon, Brice Gautier, Reinhard Kögler, Shavkat Akhmadaliev, Angela Perrat-Mabilon and Christophe Peaucelle

      Version of Record online: 20 JUL 2010 | DOI: 10.1002/sia.3657

    19. Surface analysis of Nb materials for SRF cavities (pages 151–153)

      P. Maheshwari, H. Tian, C. E. Reece, M. J. Kelley, G. R. Myneni, F. A. Stevie, J. M. Rigsbee, A. D. Batchelor and D. P. Griffis

      Version of Record online: 1 JUN 2010 | DOI: 10.1002/sia.3513

    20. Depth profiling of micrometer-order area by mesa-structure fabrication (pages 154–158)

      S. Seki, H. Tamura, Y. Wada, K. Tsutsui and S. Ootomo

      Version of Record online: 8 JUN 2010 | DOI: 10.1002/sia.3546

    21. Quantitative depth profiling of SiGe-multilayers with the Atom Probe (pages 163–166)

      Sebastian Koelling, Matthieu Gilbert, Jozefien Goossens, Andriy Hikavyy, Olivier Richard and Wilfried Vandervorst

      Version of Record online: 8 JUN 2010 | DOI: 10.1002/sia.3544

    22. Molecular depth profiling of polystyrene by electrospray droplet impact (pages 167–170)

      Yuji Sakai, Yoshitoki Iijima, Souichirou Mukou and Kenzo Hiraoka

      Version of Record online: 27 MAY 2010 | DOI: 10.1002/sia.3490

    23. C60 molecular depth profiling of bilayered polymer films using ToF-SIMS (pages 175–178)

      T. Mouhib, A. Delcorte, C. Poleunis and P. Bertrand

      Version of Record online: 27 MAY 2010 | DOI: 10.1002/sia.3539

    24. Investigation of fullerene depth distribution in PMMA-C60 blends using dual beam ToF-SIMS (pages 179–182)

      M. Py, J. P. Barnes, M. Charbonneau, R. Tiron and J. Buckley

      Version of Record online: 27 MAY 2010 | DOI: 10.1002/sia.3534

    25. Depth profiling analysis of barrier-type anodic aluminium oxide films formed on substrates of controlled roughness (pages 183–186)

      N. Trigoulet, N. Tuccitto, I. Delfanti, A. Licciardello, I. S. Molchan, P. Skeldon, G. E. Thompson, A. Tempez and P. Chapon

      Version of Record online: 11 MAY 2010 | DOI: 10.1002/sia.3410

    26. Analysis of organic multilayered samples for optoelectronic devices by (low-energy) dynamic SIMS (pages 194–197)

      K. Q. Ngo, P. Philipp, Y. Jin, S. E. Morris, M. Shtein, J. Kieffer and T. Wirtz

      Version of Record online: 11 MAY 2010 | DOI: 10.1002/sia.3451

    27. Dual beam depth profiling of organic materials: Variations of analysis and sputter beam conditions (pages 198–200)

      D. Rading, R. Moellers, F. Kollmer, W. Paul and E. Niehuis

      Version of Record online: 11 MAY 2010 | DOI: 10.1002/sia.3422

    28. Study of charge effect during Cs+ sputtering of polystyrene in the pre-equilibrium regime (pages 201–203)

      F. Wahoud, T. Mouhib, J.-N. Audinot, A. Delcorte and H.-N. Migeon

      Version of Record online: 11 MAY 2010 | DOI: 10.1002/sia.3419

    29. MCs+ depth profiling using cluster primary ions (pages 204–206)

      E. Niehuis, T. Grehl, F. Kollmer, R. Moellers, D. Rading, R. Kersting and B. Hagenhoff

      Version of Record online: 1 JUN 2010 | DOI: 10.1002/sia.3465

    30. The influence of beam energy on apparent layer thickness using ultralow energy O2+ SIMS on surface Si1−xGex (pages 211–213)

      M. G. Dowsett, R. J. H. Morris, M. Hand, A. T. Grigg, D. Walker and R. Beanland

      Version of Record online: 19 MAY 2010 | DOI: 10.1002/sia.3433

    31. Optimizing C60 incidence angle for polymer depth profiling by ToF-SIMS (pages 214–216)

      Shin-ichi Iida, Takuya Miyayama, Noriaki Sanada, Mineharu Suzuki, Gregory L. Fisher and Scott R. Bryan

      Version of Record online: 11 MAY 2010 | DOI: 10.1002/sia.3429

    32. The effect of incident energy on molecular depth profiling of polymers with large Ar cluster ion beams (pages 221–224)

      Satoshi Ninomiya, Kazuya Ichiki, Hideaki Yamada, Yoshihiko Nakata, Toshio Seki, Takaaki Aoki and Jiro Matsuo

      Version of Record online: 9 JUL 2010 | DOI: 10.1002/sia.3656

    33. Energy-dependent fragmentation of polystyrene molecule using size-selected Ar gas cluster ion beam projectile (pages 241–244)

      Kousuke Moritani, Gen Mukai, Michihiro Hashinokuchi and Kozo Mochiji

      Version of Record online: 1 JUN 2010 | DOI: 10.1002/sia.3551

    34. Time-of-Flight secondary ion mass spectrometry (TOF-SIMS) using the metal-cluster-complex primary ion of Ir4(CO)7+ (pages 245–248)

      Yukio Fujiwara, Naoaki Saito, Hidehiko Nonaka, Atsushi Suzuki, Taisuke Nakanaga, Toshiyuki Fujimoto, Akira Kurokawa and Shingo Ichimura

      Version of Record online: 11 MAY 2010 | DOI: 10.1002/sia.3435

    35. Comparison of MeV monomer ion and keV cluster ToF-SIMS (pages 249–252)

      Brian N. Jones, Jiro Matsuo, Yoshihiko Nakata, Hideaki Yamada, John Watts, Steven Hinder, Vladimir Palitsin and Roger Webb

      Version of Record online: 27 MAY 2010 | DOI: 10.1002/sia.3520

    36. An in situ fracture device to image lipids in single cells using ToF-SIMS (pages 257–260)

      Ingela Lanekoff, Michael E. Kurczy, Kelly L. Adams, Jakob Malm, Roger Karlsson, Peter Sjövall and Andrew G. Ewing

      Version of Record online: 22 JUN 2010 | DOI: 10.1002/sia.3542

    37. Comparison of Bi1+, Bi3+ and C60+ primary ion sources for ToF-SIMS imaging of patterned protein samples (pages 261–264)

      Manish Dubey, Jérémy Brison, David W. Grainger and David G. Castner

      Version of Record online: 1 JUN 2010 | DOI: 10.1002/sia.3537

    38. Top-down approach to studying biological components using ToF-SIMS (pages 265–268)

      Alan Piwowar, John Fletcher, Nicholas Lockyer and John Vickerman

      Version of Record online: 19 MAY 2010 | DOI: 10.1002/sia.3436

    39. The effect of thin oxide film on protein sample measurement with TOF-SIMS (pages 272–276)

      Satoka Aoyagi, Masae Inoue and Takuya Mitsuoka

      Version of Record online: 19 MAY 2010 | DOI: 10.1002/sia.3443

    40. Depth profiling of lamella-phase diblock copolymers using SIMS (pages 277–280)

      Yeonhee Lee, Jihye Lee, Weon Cheol Lim, Kwanwoo Shin and Kang-Jin Kim

      Version of Record online: 1 JUN 2010 | DOI: 10.1002/sia.3511

    41. Application of TOF-SIMS to the direct determination of syringyl to guaiacyl (S/G) ratio of lignin (pages 281–284)

      Kaori Saito, Takao Kishimoto, Yasuyuki Matsushita, Takanori Imai and Kazuhiko Fukushima

      Version of Record online: 22 JUN 2010 | DOI: 10.1002/sia.3565

    42. ToF-SIMS and PCA of surface-immobilized antibodies with different orientations (pages 285–289)

      Ji-Won Park, Il-Hoon Cho, Dae Won Moon, Se-Hwan Paek and Tae Geol Lee

      Version of Record online: 11 MAY 2010 | DOI: 10.1002/sia.3440

    43. A comparison of SIMS and DESI and their complementarities (pages 294–297)

      T. L. Salter, F. M. Green, I. S. Gilmore, M. P. Seah and P. Stokes

      Version of Record online: 8 JUN 2010 | DOI: 10.1002/sia.3412

    44. ToF-SIMS characterization of the lipid layer on the hair surface. II : Effect of the 18-MEA lipid layer on surface hydrophobicity (pages 298–301)

      Masayuki Okamoto, Noriyuki Tanji, Taichi Habe, Shigeto Inoue, Shinichi Tokunaga and Hiroto Tanamachi

      Version of Record online: 19 MAY 2010 | DOI: 10.1002/sia.3406

    45. NanoSIMS50 imaging of thin samples coupled with neutral cesium deposition (pages 302–305)

      Jean-Nicolas Audinot, Armelle Cabin-Flaman, Patrick Philipp, Guillaume Legent, Tom Wirtz and Henri-Noel Migeon

      Version of Record online: 1 JUN 2010 | DOI: 10.1002/sia.3550

    46. Strontium distribution in bones and tissues of strontium ranelate-administrated rats (pages 306–309)

      M. Aranyosiova, M. Stancikova, J. Rovensky and D. Velic

      Version of Record online: 11 MAY 2010 | DOI: 10.1002/sia.3458

    47. ZnO nanoparticles enhancing secondary ion signals of Escherichia coli analyzed by ToF-SIMS (pages 310–312)

      Shiou-Ling Lei, Yu-Sheng Yin, Pei-Ling Lee and Yong-Chien Ling

      Version of Record online: 1 JUN 2010 | DOI: 10.1002/sia.3516

    48. The cuticular surface of D. melanogaster: ToF-SIMS on the fly (pages 317–321)

      J. Levine, J.-C. Billeter, U. Krull and R. Sodhi

      Version of Record online: 27 MAY 2010 | DOI: 10.1002/sia.3455

    49. Surface analysis of protein-resistant, plasma-polymerized ethylene glycol thin films (pages 331–335)

      Changrok Choi, Donggeun Jung, Dae Won Moon and Tae Geol Lee

      Version of Record online: 9 JUL 2010 | DOI: 10.1002/sia.3641

    50. Identification and Imaging of 15N labeled cells with ToF-SIMS (pages 336–339)

      Bonnie J. Tyler, Marc M. Takeno and Kip D. Hauch

      Version of Record online: 5 AUG 2010 | DOI: 10.1002/sia.3679

    51. ToF-SIMS analysis of myocardial infarcted tissue (pages 350–353)

      Ji-Won Park, Min-Ji Cha, Hyun Kyong Shon, Se-Hwa Kim, Tae Geol Lee, Dae Won Moon and Ki-Chul Hwang

      Version of Record online: 9 JUL 2010 | DOI: 10.1002/sia.3628

    52. ToF-SIMS imaging and depth profiling of HeLa cells treated with bromodeoxyuridine (pages 354–357)

      Jeremy Brison, Danielle S. W. Benoit, Shin Muramoto, Michael Robinson, Patrick S. Stayton and David G. Castner

      Version of Record online: 11 MAY 2010 | DOI: 10.1002/sia.3415

    53. MeV-energy probe SIMS imaging of major components in washed and fractured animal cells (pages 363–366)

      H. Yamada, Y. Nakata, S. Ninomiya, T. Seki, T. Aoki, J. Tamura and J. Matsuo

      Version of Record online: 1 JUN 2010 | DOI: 10.1002/sia.3408

    54. Cadmium and zinc localization by SIMS in leaves of Populus deltoides (cv. Lena) grown in a metal polluted soil (pages 367–369)

      Aude Migeon, Jean-Nicolas Audinot, Tanja Eybe, Pierre Richaud, Blaudez Damien, Henri-Noel Migeon and Michel Chalot

      Version of Record online: 1 JUN 2010 | DOI: 10.1002/sia.3445

    55. ToF-SIMS imaging of surface self-organized fractal patterns of bacteria (pages 370–375)

      N. Tuccitto, G. Marletta, S. Carnazza, L. Grasso, M. Caratozzolo, S. Guglielmino and A. Licciardello

      Version of Record online: 1 JUN 2010 | DOI: 10.1002/sia.3555

    56. Useful yields of organic molecules under dynamic SIMS cluster bombardment (pages 376–379)

      Greg Gillen, Christopher Szakal and Tim M. Brewer

      Version of Record online: 9 JUL 2010 | DOI: 10.1002/sia.3484

    57. Exploring subcellular imaging on the buncher-ToF J105 3D chemical imager (pages 380–384)

      S. Rabbani, J. S. Fletcher, N. P. Lockyer and J. C. Vickerman

      Version of Record online: 9 JUL 2010 | DOI: 10.1002/sia.3457

    58. TOF-SIMS analysis of media lubricant under laser irradiation for HAMR application (pages 406–409)

      Rong Ji, Jianwei Xu, Thomas Liew, Jun Zhang, H. Q. Xie, Baoxi Xu and T. K. L. Dao

      Version of Record online: 27 MAY 2010 | DOI: 10.1002/sia.3507

    59. ToF-SIMS characterization of the lipid layer on the hair surface. I: the damage caused by chemical treatments and UV radiation (pages 410–412)

      Taichi Habe, Noriyuki Tanji, Shigeto Inoue, Masayuki Okamoto, Shinichi Tokunaga and Hiroto Tanamachi

      Version of Record online: 11 MAY 2010 | DOI: 10.1002/sia.3407

    60. Routine TOF-SIMS instrument control using polycarbonate material (pages 417–419)

      Michael Fartmann, Reinhard Kersting and Birgit Hagenhoff

      Version of Record online: 23 NOV 2010 | DOI: 10.1002/sia.3460

    61. The transfer of organics onto glass studied by ToF-SIMS (pages 423–426)

      Naoko Sano, Marie-Laure Abel and John F. Watts

      Version of Record online: 20 JUL 2010 | DOI: 10.1002/sia.3632

    62. TOF-SIMS studies of intercalated Gibbsite and Bayerite (pages 432–435)

      Chuong L. Nguyen, Linus M. Perander, Margaret M. Hyland and James B. Metson

      Version of Record online: 20 JUL 2010 | DOI: 10.1002/sia.3630

    63. Developing ToF-SIMS methods for investigating the degradation of plastic debris on beaches (pages 443–445)

      Mark C. Biesinger, Patricia L. Corcoran and Mary Jane Walzak

      Version of Record online: 11 MAY 2010 | DOI: 10.1002/sia.3397

    64. Geochemical biosignatures preserved in microbially altered basaltic glass (pages 452–457)

      N. R. Banerjee, M. R. M. Izawa, H. M. Sapers and M. J. Whitehouse

      Version of Record online: 22 JUN 2010 | DOI: 10.1002/sia.3577

    65. A new approach to measuring D/H ratios with the Cameca IMS-7F (pages 458–461)

      Rong Liu, Sharon Hull and Mostafa Fayek

      Version of Record online: 19 MAY 2010 | DOI: 10.1002/sia.3467

    66. RIMS analysis of Ca and Cr in Genesis solar wind collectors (pages 467–469)

      I. V. Veryovkin, C. E. Tripa, A. V. Zinovev, B. V. King, M. J. Pellin and D. S. Burnett

      Version of Record online: 22 JUN 2010 | DOI: 10.1002/sia.3523

    67. SIMS depth profile analysis of particles collected in an urban environment (pages 470–474)

      P. Konarski, K. Kaczorek, B. Balcerzak, J. Haluszka, M. Scibor, I. Iwanejko and A. Zawada

      Version of Record online: 20 JUL 2010 | DOI: 10.1002/sia.3666

    68. A review of Ga+ FIB/SIMS (pages 475–478)

      Lucille A. Giannuzzi and M. Utlaut

      Version of Record online: 27 MAY 2010 | DOI: 10.1002/sia.3454

    69. From FIB-SIMS to SIMS-FIB. The prospects for a 10 nm lateral resolution SIMS instrument with full FIB functionality (pages 479–483)

      David S. McPhail, Libing Li, Richard J. Chater, Nikolai Yakovlev and Hweeleng Seng

      Version of Record online: 19 MAY 2010 | DOI: 10.1002/sia.3468

    70. Real-time localization of single C60 impacts with correlated secondary ion detection (pages 484–487)

      M. J. Eller, S. V. Verkhoturov, S. Della-Negra, R. D. Rickman and E. A. Schweikert

      Version of Record online: 11 MAY 2010 | DOI: 10.1002/sia.3400

    71. FIB-SIMS analysis of an aluminum alloy/SiC metal matrix composite (pages 488–491)

      Jonathan R. Silk, Richard J. Dashwood and Richard J. Chater

      Version of Record online: 11 MAY 2010 | DOI: 10.1002/sia.3439

    72. Three-dimensional reconstruction of a nickel- alumina composite coating by FIB-SIMS (pages 492–494)

      Richard J. Chater, Ilaria Corni, Aldo R. Boccaccini and Mary P. Ryan

      Version of Record online: 19 MAY 2010 | DOI: 10.1002/sia.3453

    73. Strategies for improving the sensitivity of FIB-SIMS (pages 495–497)

      Libing Li, David S. McPhail, Nikolai Yakovlev and Hweeleng Seng

      Version of Record online: 11 MAY 2010 | DOI: 10.1002/sia.3450

    74. A new time-of-flight SIMS instrument for 3D imaging and analysis (pages 506–509)

      Rowland Hill, Paul Blenkinsopp, Stephen Thompson, John Vickerman and John S. Fletcher

      Version of Record online: 20 JUL 2010 | DOI: 10.1002/sia.3562

    75. VAMAS interlaboratory study on organic depth profiling. Part I: Preliminary report (pages 510–513)

      A. G. Shard, R. Foster, I. S. Gilmore, J. L. S. Lee, S. Ray and L. Yang

      Version of Record online: 13 APR 2010 | DOI: 10.1002/sia.3268

    76. New neutral cesium evaporation chamber and UHV suitcase (pages 514–517)

      B. Bendler, R. Barrahma, P. Philipp and T. Wirtz

      Version of Record online: 8 JUN 2010 | DOI: 10.1002/sia.3518

    77. Surface and interface analysis of iodine-doped pentacene structures for OTFTs (pages 518–521)

      J. Jakabovič, A. Vincze, J. Kováč, R. Srnánek, J. Kováč Jr, E. Dobročka, D. Donoval, U. Heinemeyer, F. Schreiber, V. Machovič and F. Uherek

      Version of Record online: 11 MAY 2010 | DOI: 10.1002/sia.3420

    78. Advanced SIMS quantification in the first few nm of B, P and As ultrashallow implants (pages 522–524)

      A. Merkulov, P. Peres, S. Choi, F. Desse and M. Schuhmacher

      Version of Record online: 8 JUN 2010 | DOI: 10.1002/sia.3459

    79. Experimental demonstration of mass-filtered, time-dilated, time-of-flight mass spectrometry (pages 525–528)

      L. T. Demoranville, K. S. Grabowski, D. L. Knies and C. Cetina

      Version of Record online: 8 JUN 2010 | DOI: 10.1002/sia.3524

    80. Interactive spatio-spectral analysis of three-dimensional mass-spectral (3DxMS) chemical images (pages 529–534)

      Professor Stephen E. Reichenbach, Xue Tian, Robert Lindquist, Qingping Tao, Alex Henderson and John C. Vickerman

      Version of Record online: 9 JUL 2010 | DOI: 10.1002/sia.3553

    81. Numerical approach to resolve mass interference in depth profiling As in SiGe (pages 535–538)

      D. Gui, Y. H. Huang, R. R. Nistala, Z. X. Xing, Z. Q. Mo, Y. N. Hua and L. Z. Cha

      Version of Record online: 8 JUN 2010 | DOI: 10.1002/sia.3540

    82. Examination of individual nanoparticles with cluster SIMS (pages 547–550)

      S. Rajagopalachary, S. V. Verkhoturov and E. A. Schweikert

      Version of Record online: 22 JUN 2010 | DOI: 10.1002/sia.3564

    83. Probing chemical homogeneity within single cluster impact sites (pages 551–554)

      Veronica Pinnick, Stanislav V. Verkhoturov, Leonid Kaledin and Emile A. Schweikert

      Version of Record online: 11 MAY 2010 | DOI: 10.1002/sia.3395

    84. Characterization and quantification of biological micropatterns using cluster SIMS (pages 555–558)

      Li-Jung Chen, Sunny S. Shah, Stanislav V. Verkhoturov, Alexander Revzin and Emile A. Schweikert

      Version of Record online: 11 MAY 2010 | DOI: 10.1002/sia.3399

    85. D-SIMS analysis supporting SiOxNy film in-line metrology (pages 559–561)

      Thanas Budri and Donald Getchell

      Version of Record online: 22 JUN 2010 | DOI: 10.1002/sia.3608

    86. Imaging analysis of cosmetic ingredients interacted with human hair using TOF-SIMS (pages 562–565)

      T. Kojima, H. Kitano, M. Niwa, K. Saito, Y. Matsushita and K. Fukushima

      Version of Record online: 22 JUN 2010 | DOI: 10.1002/sia.3635

    87. Nano-SIMS investigation of boron distribution in steels (pages 573–575)

      N. Valle, J. Drillet, A. Pic and H.-N. Migeon

      Version of Record online: 8 JUN 2010 | DOI: 10.1002/sia.3531

    88. Distribution of inkjet ink components via ToF-SIMS imaging (pages 576–581)

      A. Filenkova, E. Acosta, P. M. Brodersen, R. N. S. Sodhi and R. Farnood

      Version of Record online: 30 MAR 2010 | DOI: 10.1002/sia.3352

    89. An analyis of trace metal contaminants on silicon surface by VPD-ToF-SIMS and VPD-SIMS: towards 1E6-1E7at/cm2 detection limits (pages 582–585)

      Marc Juhel, Chantal Trouiller, Denis Guiheux, Cyril Arsac, Nathalie Drogue, Stephanie Couvrat and Catherine Grosjean

      Version of Record online: 11 MAY 2010 | DOI: 10.1002/sia.3428

    90. Investigation of imaging ToF-SIMS as a means to study coatings on wood (pages 595–599)

      Mojgan Nejad, Paul Cooper and Rana Sodhi

      Version of Record online: 22 JUN 2010 | DOI: 10.1002/sia.3619

    91. Investigation of a connector electrical failure (pages 600–603)

      Peter Arrowsmith, Prakash Kapadia, Al Hawley and Rana Sodhi

      Version of Record online: 20 JUL 2010 | DOI: 10.1002/sia.3638

    92. ToF-SIMS and XPS characterization of antimicrobial textiles for the food processing industry (pages 604–608)

      Céline Brunon, François Bessueille, Carol Grossiord, Elise Chadeau, Nadia Oulahal, Christine Darroux, Isabelle Ferreira, Michel Bourgeois, Farida Simon, Fabrice Rimbault, Caroline Yu and Didier Leonard

      Version of Record online: 9 JUL 2010 | DOI: 10.1002/sia.3654

    93. D & TOF-SIMS failure analysis of P-buried layer from BiCMOS transistors (pages 609–611)

      Thanas Budri, Akshey Sehgal, Scott Arsenault, Jeffrey Klatt, Wibo Van Noort, Scott Ruby, Jamal Ramdani, Paul Allard and Albert Schnieders

      Version of Record online: 9 JUL 2010 | DOI: 10.1002/sia.3668

    94. SIMS and thermal evolution analysis of oxygen in Zr-1%Nb alloy after high-temperature transitions (pages 618–620)

      J. Lorincik, V. Klouc̆ek, M. Negyesi, J. Kabátová, L. Novotný and V. Vrtilkova

      Version of Record online: 8 JUN 2010 | DOI: 10.1002/sia.3545

    95. Failure analysis of fine Cu patterning by shave-off profiling (pages 621–624)

      M. Nojima, M. Fujii, Y. Kakuhara, H. Tsuchiya, A. Kameyama, S. Yokogawa, M. Owari and Y. Nihei

      Version of Record online: 11 MAY 2010 | DOI: 10.1002/sia.3396

    96. Insight into the swelling mechanism involved in the recovery of serial numbers erased from polymer surfaces (pages 625–627)

      Xavier A. Conlan, Matthew J. Baker, Richard Krieg, Nicholas P. Lockyer, John C. Vickerman, Neil W. Barnett and Kieran F. Lim

      Version of Record online: 19 MAY 2010 | DOI: 10.1002/sia.3510

    97. ToF-SIMS imaging and spectroscopic analyses of PEG-conjugated AuNPs (pages 628–631)

      Hyun Kyong Shon, Miyoung Son, Kyong Mi Park, Choong Kyun Rhee, Nam Woong Song, Hyun Min Park, Dae Won Moon and Tae Geol Lee

      Version of Record online: 19 MAY 2010 | DOI: 10.1002/sia.3508

    98. The use of low-energy SIMS (LE-SIMS) for nanoscale fuel cell material development (pages 635–638)

      R. J. H. Morris, S. Fearn, J. Perkins, J. Kilner, M. G. Dowsett, M. D. Beigalski and C. M. Rouleau

      Version of Record online: 1 JUN 2010 | DOI: 10.1002/sia.3526

    99. Evaluation of ionization yields under gallium bombardment (pages 639–642)

      Gilles Frache, Brahim El Adib, Jean-Nicolas Audinot and Henri-Noel Migeon

      Version of Record online: 27 MAY 2010 | DOI: 10.1002/sia.3418

    100. SIMS analytical technique for PV applications (pages 643–645)

      P. Peres, A. Merkulov, F. Desse and M. Schuhmacher

      Version of Record online: 27 MAY 2010 | DOI: 10.1002/sia.3525

    101. Depth-profiling analysis of MOCVD-grown triple junction solar cells by SIMS (pages 646–648)

      Helena Téllez, José M. Vadillo, Egbert Rodríguez Messmer, Javier Miguel-Sánchez and J. Javier Laserna

      Version of Record online: 27 MAY 2010 | DOI: 10.1002/sia.3517

    102. A beneficial application of backside SIMS for the depth profiling characterization of implanted silicon (pages 654–656)

      N. Fujiyama, T. Hasegawa, T. Suda, T. Yamamoto, T. Miyagi, K. Yamada and A. Karen

      Version of Record online: 9 JUL 2010 | DOI: 10.1002/sia.3646

    103. SIMS quantification of SiGe composition with low-energy ion beams (pages 657–660)

      Zhengmao Zhu, Paul Ronsheim, Andrew Turansky, Michael Hatzistergos, Anita Madan, Teresa Pinto, Judson Holt and Alexander Reznicek

      Version of Record online: 22 JUN 2010 | DOI: 10.1002/sia.3620

    104. Using C60+ sputtering to improve detection limit of nitrogen in zinc oxide (pages 661–663)

      Zihua Zhu, Vaithiyalingam Shutthanandan and Ponnusamy Nachimuthu

      Version of Record online: 11 MAY 2010 | DOI: 10.1002/sia.3414

    105. Elaboration and quantitative investigation of BCN-type films by dynamic SIMS using the MCsx+ mode (pages 669–672)

      Fang Wu, Nathalie Valle, Ryan Fitzpatrick, John G. Ekerdt, L. Houssiau and Henri-Noël Migeon

      Version of Record online: 9 JUL 2010 | DOI: 10.1002/sia.3532

    106. Optimization and comparison of depth profiling in GaAs and GaSb with TOF-SIMS (pages 673–675)

      A. Herrmann, T. Lehnhardt, M. Strauß, M. Kamp and A. Forchel

      Version of Record online: 9 JUL 2010 | DOI: 10.1002/sia.3659

  4. Errata

    1. Top of page
    2. Preface
    3. Editorials
    4. SIMS Proceedings Papers
    5. Errata
    1. You have free access to this content

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