Concept
Near-Edge X-ray Absorption Fine Structure Spectroscopy as a Tool for Investigating Nanomaterials
Article first published online: 5 DEC 2005
DOI: 10.1002/smll.200500256
Copyright © 2006 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Additional Information
How to Cite
Hemraj-Benny, T., Banerjee, S., Sambasivan, S., Balasubramanian, M., Fischer, Daniel A., Eres, G., Puretzky, Alexander A., Geohegan, David B., Lowndes, Douglas H., Han, W., Misewich, James A. and Wong, Stanislaus S. (2006), Near-Edge X-ray Absorption Fine Structure Spectroscopy as a Tool for Investigating Nanomaterials. Small, 2: 26–35. doi: 10.1002/smll.200500256
Publication History
- Issue published online: 5 DEC 2005
- Article first published online: 5 DEC 2005
- Abstract
- Article
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Keywords:
- carbon nanotubes;
- functionalization;
- nanomaterials;
- NEXAFS spectroscopy;
- surface analysis
Abstract
We have demonstrated near-edge X-ray absorption fine structure (NEXAFS) spectroscopy as a particularly useful and effective technique for simultaneously probing the surface chemistry, surface molecular orientation, degree of order, and electronic structure of carbon nanotubes and related nanomaterials. Specifically, we employ NEXAFS in the study of single-walled carbon nanotube and multi-walled carbon nanotube powders, films, and arrays, as well as of boron nitride nanotubes. We have focused on the advantages of NEXAFS as an exciting, complementary tool to conventional microscopy and spectroscopy for providing chemical and structural information about nanoscale samples.

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