Robust Single-Nanoparticle Probe for Contact-Mode Analysis and Dip-Pen Nanolithography

Authors


  • This work was supported by the NRL grant funded by the KOSEF (No. R0A-2004-000-10438-0). T.K. was supported by a Seoul Science Fellowship. S.H. acknowledges equipment support from the Nano-Systems Institute National Core Research Center program of the Korea Science and Engineering Foundation.

Abstract

original image

Stable tapping-mode imaging, contact-mode force analysis, and dip-pen nanolithography are demonstrated using a robust single-nanoparticle probe (sNP; see image) prepared by a directed-assembly method. Extensive analysis of the tip-convolution effect and mechanical properties of the sNP probe is performed under various contact-force conditions.

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