In situ Nanomechanical Characterization of Single-Crystalline Boron Nanowires by Buckling

Authors

  • Chia-Hung Lin,

    1. Department of Mechanical Engineering University of South Carolina 300 Main Street, Columbia, SC 29208 (USA)
    2. Department of Mechanical Engineering and R&D Center for Membrane Technology Chung Yuan Christian University Chung Li, Taiwan 320 (P.R. China)
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  • Hai Ni,

    1. Department of Mechanical Engineering University of South Carolina 300 Main Street, Columbia, SC 29208 (USA)
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  • Xinnan Wang,

    1. Department of Mechanical Engineering University of South Carolina 300 Main Street, Columbia, SC 29208 (USA)
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  • Ming Chang,

    1. Department of Mechanical Engineering and R&D Center for Membrane Technology Chung Yuan Christian University Chung Li, Taiwan 320 (P.R. China)
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  • Yuh J. Chao,

    1. Department of Mechanical Engineering University of South Carolina 300 Main Street, Columbia, SC 29208 (USA)
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  • Juti Rani Deka,

    1. Department of Mechanical Engineering and R&D Center for Membrane Technology Chung Yuan Christian University Chung Li, Taiwan 320 (P.R. China)
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  • Xiaodong Li

    Corresponding author
    1. Department of Mechanical Engineering University of South Carolina 300 Main Street, Columbia, SC 29208 (USA)
    • Department of Mechanical Engineering University of South Carolina 300 Main Street, Columbia, SC 29208 (USA).
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  • Financial support for this study was provided by the National Science Foundation (CMMI-0653651; CMMI-0824728, and EPS-0296165), the ACS Petroleum Research Fund (ACS PRF# 40450-AC10), the University of South Carolina NanoCenter, the Center-of-Excellence Program on Membrane Technology, the Ministry of Education, Taiwan, Republic of China (Grant No. 956049303), and the National Science Council of Taiwan, Republic of China (NSC 95-2221-E-033-038).

Abstract

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Nanomechanical characterization of single-crystalline boron nanowires is carried out by buckling individual nanowires with a nanomanipulator inside a scanning electron microscope in situ. The buckling behavior is studied and the applied load curves analyzed. A general calibration procedure for precisely measuring the mechanical properties of nanowires is established.

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