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Keywords:

  • carbon nanotubes;
  • characterization;
  • optical microscopy;
  • fluorescence
Thumbnail image of graphical abstract

The optical bright- and dark-field visualization (see image) of single-walled carbon nanotubes spin-casted onto Si/SiO2 substrates with a 300-nm-thick oxide coating is reported. This novel procedure gives access to a low-cost correlation of Raman spectroscopy with microscopic techniques (atomic force microscopy, scanning electron microscopy) greatly facilitating nanotube characterization.