Scanning photocurrent and fluorescence microscopy, along with local voltage-dependent photocurrent measurements, are used to study spatial variations in electronic and optical properties across an as-fabricated, functional Cu(In1-xGax)Se2 (CIGS) nanocrystal-based photovoltaic device. Through correlation of local morphological features with spatial variations in device properties, a greater understanding of photovoltaic performance is obtained.
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