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Keywords:

  • atomic force microscopy;
  • contact resonance force microscopy;
  • mechanical properties;
  • nanotribology;
  • single-asperity contacts
Thumbnail image of graphical abstract

Contact resonance force microscopy is used during AFM scanning to resolve instantaneous and progressive nanometer-scale changes in the contact radius between an AFM tip and a silicon substrate. High-resolution quantitative measurements of contact radius reveal real-time information on wear rate, fracture, and tip-symmetry.