Full Paper
Controlled Collapse of High-Aspect-Ratio Nanostructures
Article first published online: 2 AUG 2011
DOI: 10.1002/smll.201100892
Copyright © 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Additional Information
How to Cite
Duan, H., Yang, J. K. W. and Berggren, K. K. (2011), Controlled Collapse of High-Aspect-Ratio Nanostructures. Small, 7: 2661–2668. doi: 10.1002/smll.201100892
Publication History
- Issue published online: 12 SEP 2011
- Article first published online: 2 AUG 2011
- Manuscript Revised: 20 JUN 2011
- Manuscript Received: 7 MAY 2011
Keywords:
- aspect ratio;
- controlled collapse;
- electron-beam lithography;
- nanostructures;
- self-assembly
Abstract
Capillary-force-induced collapse of high-aspect-ratio (HAR) micro- and nanostructures is common in the evaporation–drying process and a number of applications based on the collapse have been proposed. However, the collapse of small HAR structures is usually uncontrollable, which has prevented it from being used in engineering applications. Here, the collapse of 10-nm-scale structures is separately controlled through engineering an asymmetric cross section, curvature, and tilt in the structures prior to collapse. It is shown that this deterministic-collapse approach can be used to create linear structures from collapsed pillars and planar rectangular structures from collapsed fencelike linear structures, and can further be used to create small gaps by controlling the collapse of nearby structures. These techniques could be used to improve the performance of beam-based lithography methods for certain types of patterns by increasing throughput and resolution, reducing the proximity effect, and reducing irradiation damage. In addition, this controlled-collapse concept provides a possible platform with which to study mechanical behavior at the 10-nm scale.

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