Silicon Nanowire Charge-Trap Memory Incorporating Self-Assembled Iron Oxide Quantum Dots
Version of Record online: 10 SEP 2012
Copyright © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Volume 8, Issue 22, pages 3417–3421, November 19, 2012
How to Cite
Huang, R.-G. and Heath, J. R. (2012), Silicon Nanowire Charge-Trap Memory Incorporating Self-Assembled Iron Oxide Quantum Dots. Small, 8: 3417–3421. doi: 10.1002/smll.201200940
- Issue online: 14 NOV 2012
- Version of Record online: 10 SEP 2012
- Manuscript Received: 1 MAY 2012
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