Generation of CNTs on STM Probes Using the Simple Arc Discharge Method

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Abstract

We succeeded in producing carbon nanotubes (CNTs) on scanning tunneling microscope (STM) probes using the simple arc discharge method. We used STM probes with a diameter of 200 µm (500 nm in diameter at the tip), and placed them in a position 5 mm from a set of carbon electrodes between which a direct current discharge of 30 V/20 A was applied. The results of scanning electron microscopy observation confirmed that the fine particles generated included high-purity CNTs on the STM probe surface. Specifically, CNTs were generated directly on the surface of the STM probe. This study indicates that the technique is suitable for nano-analysis application in the field of nanotechnology. © 2009 Institute of Electrical Engineers of Japan. Published by John Wiley & Sons, Inc.

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