Advanced Scanning Probes for Micro–Nano Science Researches



In this study, we introduce five unique scanning probes developed in our laboratory for different fields of application. These probes are the results of excellent collaborations with many external partners. Each probe possesses many advanced features that one can hardly obtain with plane probes for conventional optical deflection system. The applications of these probes are very versatile, from atomic force microscope for the exploration of Mars to in vivo measurements of human knee cartilage. Copyright © 2010 Institute of Electrical Engineers of Japan. Published by John Wiley & Sons, Inc.