Advanced Scanning Probes for Micro–Nano Science Researches
Article first published online: 20 APR 2010
Copyright © 2010 Institute of Electrical Engineers of Japan
IEEJ Transactions on Electrical and Electronic Engineering
Special Issue: Special Issue on Energy Saving Technologies on Electric Railways in Japan
Volume 5, Issue 3, pages 259–262, May 2010
How to Cite
Akiyama, T., Gautsch, S., Parrat, D., Imer, R., Vettiger, P., Staufer, U. and de Rooij, N. F. (2010), Advanced Scanning Probes for Micro–Nano Science Researches. IEEJ Trans Elec Electron Eng, 5: 259–262. doi: 10.1002/tee.20527
- Issue published online: 20 APR 2010
- Article first published online: 20 APR 2010
- Manuscript Received: 27 JUL 2009
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