Home Help
Copyright © 2013 Institute of Electrical Engineers of Japan
Volume 7, Issue 5
Pages 443–537
Cheng Lin, Zhong Lisheng, Zhang Yue, Yu Qinxue and Shi Yizhou
Article first published online: 17 JUL 2012 | DOI: 10.1002/tee.21755
Takatoshi Shindo, Tsuguhiro Takahashi, Tatsuki Okamoto and Takashi Kuraishi
Article first published online: 17 JUL 2012 | DOI: 10.1002/tee.21756
Kiing Ing Wong
Article first published online: 12 JUN 2012 | DOI: 10.1002/tee.21757
Yasir Hashim and Othman Sidek
Article first published online: 17 JUL 2012 | DOI: 10.1002/tee.21758
Shantanu Chakraborty, Tomonobu Senjyu, Ahmed Yousuf Saber, Atsushi Yona and Toshihisa Funabashi
Article first published online: 12 JUN 2012 | DOI: 10.1002/tee.21759
Chang Liu, Takao Tsuji and Tsutomu Oyama
Article first published online: 30 JUL 2012 | DOI: 10.1002/tee.21760
Article first published online: 12 JUN 2012 | DOI: 10.1002/tee.21761
Tarek Hassan Mohamed, Jorge Morel, Hassan Bevrani, Ahmed Abd-Eltawwab Hassan, Yehia Sayed Mohamed and Takashi Hiyama
Article first published online: 19 JUN 2012 | DOI: 10.1002/tee.21762
Yukinori Nakamura, Takuji Tachibana and Genki Matsui
Article first published online: 10 JUL 2012 | DOI: 10.1002/tee.21763
Hitoshi Takata, Tomohiro Hachino, Seiji Motoyama, Kazutomo Yunokuchi and Kimihisa Kawabata
Article first published online: 19 JUN 2012 | DOI: 10.1002/tee.21765
Fukutaro Nagai, Yuichi Noro, Takashi Takeo and Haruhiko Ito
Article first published online: 12 JUN 2012 | DOI: 10.1002/tee.21766
Chang Li and Kosuke Sato
Article first published online: 1 AUG 2012 | DOI: 10.1002/tee.21767
Wei Wang, Fuji Ren and Motoyuki Suzuki
Article first published online: 17 JUL 2012 | DOI: 10.1002/tee.21768
Shuanghui Hao, Zili Tang, Minghui Hao and Yoshio Mizugaki
Article first published online: 12 JUN 2012 | DOI: 10.1002/tee.21769
Haixiang Zang, Qingshan Xu and Katsuhiro Ichiyanagi
Article first published online: 19 JUN 2012 | DOI: 10.1002/tee.21770