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Copyright © 2013 Institute of Electrical Engineers of Japan
Volume 7, Issue 6
Pages 539–648
Ke Du and Lin Peng
Article first published online: 4 SEP 2012 | DOI: 10.1002/tee.21764
Kazunori Moriki and Motoshige Yumoto
Article first published online: 9 OCT 2012 | DOI: 10.1002/tee.21771
Yujiro Naruse
Article first published online: 9 OCT 2012 | DOI: 10.1002/tee.21772
Yoh Yasuda, Shigeru Yokoyama, Masayuki Minowa and Tomoyuki Satoh
Article first published online: 9 OCT 2012 | DOI: 10.1002/tee.21773
Vichakorn Hengsritawat and Thavatchai Tayjasanant
Article first published online: 18 SEP 2012 | DOI: 10.1002/tee.21774
Hiroyuki Okuda, Shinkichi Inagaki and Tatsuya Suzuki
Article first published online: 20 SEP 2012 | DOI: 10.1002/tee.21775
Deng Zhang, Shingo Mabu, Feng Wen and Kotaro Hirasawa
Article first published online: 27 SEP 2012 | DOI: 10.1002/tee.21776
Osamu Sakata, Makoto Ohki and Yoichi Saito
Article first published online: 27 SEP 2012 | DOI: 10.1002/tee.21777
Mouayad A. Sahib, Raja Kamil and Mohammad H. Marhaban
Article first published online: 20 SEP 2012 | DOI: 10.1002/tee.21778
Shotaro Miwa, Hiroshi Kage and Kazuhiko Sumi
Article first published online: 18 SEP 2012 | DOI: 10.1002/tee.21779
Ali Peiravi and Mohammad Asyaei
Article first published online: 18 SEP 2012 | DOI: 10.1002/tee.21780
Muhammad Qasim Khan and Steinar Hidle Andresen
Article first published online: 7 AUG 2012 | DOI: 10.1002/tee.21781
Carlos Sicre, Asunción P. Cucala, Antonio Fernández and Piotr Lukaszewicz
Article first published online: 18 SEP 2012 | DOI: 10.1002/tee.21782
Jin Xu and Yukihiko Sato
Article first published online: 18 SEP 2012 | DOI: 10.1002/tee.21783