Now at the Medical University of Vienna, Centre for Biomedical Engineering and Physics, Divison of Medical Physics, Wäringerstrasse 13, 1090 Vienna, Austria.
Research Article
Using swept-source optical coherence tomography to monitor the formation of neo-epidermis in tissue-engineered skin
Article first published online: 17 NOV 2010
DOI: 10.1002/term.281
Copyright © 2010 John Wiley & Sons, Ltd.
Issue

Journal of Tissue Engineering and Regenerative Medicine
Volume 4, Issue 8, pages 652–658, December 2010
Additional Information
How to Cite
Smith, L. E., Bonesi, M., Smallwood, R., Matcher, S. J. and MacNeil, S. (2010), Using swept-source optical coherence tomography to monitor the formation of neo-epidermis in tissue-engineered skin. Journal of Tissue Engineering and Regenerative Medicine, 4: 652–658. doi: 10.1002/term.281
Publication History
- Issue published online: 17 NOV 2010
- Article first published online: 17 NOV 2010
- Manuscript Accepted: 25 FEB 2010
- Manuscript Received: 15 OCT 2009
- Abstract
- Article
- References
- Cited By
Keywords:
- non-invasive imaging;
- optical coherence tomography;
- tissue-engineered skin;
- re-epithelialization;
- acellular dermis;
- collagen gels
Abstract
There is an increasing need for a robust, simple to use, non-invasive imaging technology to follow tissue-engineered constructs as they develop. Our aim was to evaluate the use of swept-source optical coherence tomography (SS-OCT) to image tissue-engineered skin as it developed over several weeks. Tissue-engineered skin was produced using both de-epithelialized acellular dermis (DED) and amorphous collagen gels. In both cases the epidermis could be readily distinguished from the neodermis, based on a comparison with standard destructive histology of samples. Constructs produced with DED showed more epidermal/dermal maturation than those produced using collagen. The development of tissue-engineered skin based on DED was accurately monitored with SS-OCT over 3 weeks and confirmed with conventional histology. Copyright © 2010 John Wiley & Sons, Ltd.

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