Trace element profiling of gunshot residues by PIXE and SEM-EDS: a feasibility study
Version of Record online: 20 FEB 2009
Copyright © 2009 John Wiley & Sons, Ltd.
Special Issue: EXRS 2008 - European Conference on X-Ray Spectrometry.
Volume 38, Issue 3, pages 190–194, May/June 2009
How to Cite
Bailey, M. J., Kirkby, K. J. and Jeynes, C. (2009), Trace element profiling of gunshot residues by PIXE and SEM-EDS: a feasibility study. X-Ray Spectrom., 38: 190–194. doi: 10.1002/xrs.1142
- Issue online: 14 APR 2009
- Version of Record online: 20 FEB 2009
- Manuscript Accepted: 5 DEC 2008
- Manuscript Revised: 4 DEC 2008
- Manuscript Received: 26 JUN 2008
A feasibility study was carried out into the use of particle-induced x-ray emission (PIXE) on the ion microprobe for the characterisation of gunshot residues (GSR). We compare these results with the conventional technique, scanning electron microscopy with energy dispersive x-ray spectroscopy (SEM-EDS). Samples of gunshot residue from four different sources were collected. Individual particles of GSR were analysed by SEM-EDS using a 30-keV electron beam focussed to ∼10 nm, and PIXE using a 2.5-MeV proton beam focussed to ∼4 µm. PIXE revealed trace or minor elements undetectable by SEM-EDS, thereby strengthening the discrimination between different types of GSR. Copyright © 2009 John Wiley & Sons, Ltd.