Supporting Information for this article is available on the WWW under http://dx.doi.org/10.1002/zaac.201200296 or from the author.
Structural Effects on the Electronic Properties of TlCu7–δS4 Investigated by Diffraction-Resistance Measurements†
Article first published online: 29 AUG 2012
Copyright © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Zeitschrift für anorganische und allgemeine Chemie
Special Issue: Chalcogenides and Chalcogenidometalates: From Basic Research to Fundamental Applications
Volume 638, Issue 15, pages 2565–2570, December 2012
How to Cite
Engin, T. E., Hull, S. and Powell, A. V. (2012), Structural Effects on the Electronic Properties of TlCu7–δS4 Investigated by Diffraction-Resistance Measurements . Z. anorg. allg. Chem., 638: 2565–2570. doi: 10.1002/zaac.201200296
- Issue published online: 18 DEC 2012
- Article first published online: 29 AUG 2012
- Manuscript Accepted: 29 AUG 2012
- Manuscript Received: 25 JUN 2012
- Electron transport;
- Neutron diffraction;
The design and construction of a specialised sample cell for the simultaneous investigation of electron-transport and structural properties by powder neutron diffraction in the temperature range1.5 ≤ T /K ≤ 300 is described. This cell has been used to investigate the structural origin of anomalies in the transport properties of the pseudo-one-dimensional ternary sulfide TlCu7–δS4 (δ = 0.15). The data reveal an anomaly in ρ(T) observed at 255 K, which is associated with a phase change involving a change in symmetry from I4/m to P4/n on cooling. This corresponds to a doubling of the crystallographic c axis and is evidenced by the splitting of a strong reflection at d = 2.28 Å and the appearance of additional peaks in the low-temperature diffraction data. A lower temperature ρ(T) anomaly at 205 K is related to subtle structural distortions involving chains of edge-shared Cu4 tetrahedra.