Supporting Information for this article is available on the WWW under http://dx.doi.org/10.1002/zaac.201200296 or from the author.
Structural Effects on the Electronic Properties of TlCu7–δS4 Investigated by Diffraction-Resistance Measurements†
Article first published online: 29 AUG 2012
Copyright © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Zeitschrift für anorganische und allgemeine Chemie
Special Issue: Chalcogenides and Chalcogenidometalates: From Basic Research to Fundamental Applications
Volume 638, Issue 15, pages 2565–2570, December 2012
How to Cite
Engin, T. E., Hull, S. and Powell, A. V. (2012), Structural Effects on the Electronic Properties of TlCu7–δS4 Investigated by Diffraction-Resistance Measurements . Z. anorg. allg. Chem., 638: 2565–2570. doi: 10.1002/zaac.201200296
- Issue published online: 18 DEC 2012
- Article first published online: 29 AUG 2012
- Manuscript Accepted: 29 AUG 2012
- Manuscript Received: 25 JUN 2012
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