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Auxiliary material for this article contains further quantification and details concerning the method used to perform the degradation corrections for the SORCE SIM instrument.

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Additional file information is provided in the readme.txt.

FilenameFormatSizeDescription
grl25584-sup-0001-readme.txtplain text document5Kreadme.txt
grl25584-sup-0002-txts01.texapplication/x-tex999Text S1. Physical basis of SIM degradation corrections, SIM degradation equations, SIM A-to-SIM B comparison, and final correction to TSI.
grl25584-sup-0003-txts01.pdfPDF document75KText S1. Physical basis of SIM degradation corrections, SIM degradation equations, SIM A-to-SIM B comparison, and final correction to TSI.
grl25584-sup-0004-fs01.epsPS document1293KFigure S1. Measured exposure time for SIM A and B and derivative of the column with respect to exposure time and normalized to the value on 2004/06/06.
grl25584-sup-0005-fs02.epsPS document3688KFigure S2. Rays diverging with a 1/2 degree angle entering the prism.
grl25584-sup-0006-fs03.epsPS document4234KFigure S3. An example of the SIM A-to-SIM B comparison experiment.
grl25584-sup-0007-fs04.epsPS document914KFigure S4. Kappa-function derived from the SIM A-to-SIM B comparison experiments.
grl25584-sup-0008-fs05.epsPS document1143KFigure S5. Graphical representation of equations (2.1), (2.2), (2.3), and (2.4).

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