Advanced Scanning Electron Microscopy and X Ray Microanalysis
Article first published online: 3 JUN 2011
©1988. American Geophysical Union. All Rights Reserved.
Eos, Transactions American Geophysical Union
Volume 69, Issue 35, page 821, 30 August 1988
How to Cite
1988), Advanced Scanning Electron Microscopy and X Ray Microanalysis, Eos Trans. AGU, 69(35), 821–821, doi:10.1029/88EO01092.(
- Issue published online: 3 JUN 2011
- Article first published online: 3 JUN 2011
- Cited By
This text is the third in a group that evolved from a short course taught annually at Lehigh University, Bethlehem, Pa., since 1972. Chapters on magnetic contrast a nd electron channeling, dropped from the second volume for reasons of space, are included here along with new topics such as image processing. The first seven chapters should be oT value to those geologists interested in scanning electron microscopy (SEM) and microanalysis. Chapters 8 and 9, concerned with specimen preparation for biological SEM a nd cryomicroscopy, make up about one third of the text.