Characterization of power-dependent high-Tc superconducting microstrip line by modified spectral domain method


  • Yaozhong Liu,

  • Tatsuo Itoh


Surface resistance of the high-Tc superconducting thin film may depend upon the power level of the thin film surface. An iteration method using the spectral domain technique with an application of complex resistive boundary condition is adopted to analyze such a nonlinear problem. Numerical results for the phase and attenuation constants and current distributions are given for different structural and material parameters.