New “Nano Probe” to be available for EM

Authors

  • Anonymous


Abstract

A new kind of electron microscope system was demonstrated at the 9th International Congress on Electron Microscopy. The new system adds a patented ‘twin lens’ objective and a scanning transmission control unit (STEM) to the Philips EM-400 electron microscope. This makes imaging at atomic resolution possible with the capability of analyzing materials as tiny as a billionth of a meter with the STEM's ‘Nano Probe,’ which fires a finely focused beam of electrons at the sample.

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