Article first published online: 3 JUN 2011
©1983. American Geophysical Union. All Rights Reserved.
Eos, Transactions American Geophysical Union
Volume 64, Issue 23, page 401, 7 June 1983
How to Cite
1983), Subangstrom microscopy, Eos Trans. AGU, 64(23), 401–401, doi:10.1029/EO064i023p00401-02.(
- Issue published online: 3 JUN 2011
- Article first published online: 3 JUN 2011
- Cited By
Materials scientists, solid state geophysicists, geochemists, and mineralogists are becoming increasingly interested in examining surfaces of crystals at ultrahigh resolution. Modern scanning transmission electron microscopy (STEM) techniques have resolution of better than 10−8 m (100 Å) a requirement for studying microexsolution features in crystals. Electron microscopy and microprofilometer techniques have become standard in the examination of surface features of polished crystals. There remain numerous features, atomic clusters, lattice point crystals and defect phenomena that have not been resolved, but which will be amenable to the newly invented scanning tunneling microscopy methods.