Exafs and Xanes Study Under Pressure
- Murli H. Manghnani and
- Yasuhiko Syono
Published Online: 21 MAR 2013
Copyright © 1987 by Terra Scientific Publishing Company (TERRAPUB), Tokyo.
High-Pressure Research in Mineral Physics: A Volume in Honor of Syun-iti Akimoto
How to Cite
Shimomura, O. and Kawamura, T. (1987) Exafs and Xanes Study Under Pressure, in High-Pressure Research in Mineral Physics: A Volume in Honor of Syun-iti Akimoto (eds M. H. Manghnani and Y. Syono), American Geophysical Union, Washington, D. C.. doi: 10.1029/GM039p0187
- Published Online: 21 MAR 2013
- Published Print: 1 JAN 1987
Print ISBN: 9780875900667
Online ISBN: 9781118664124
- Mineralogy and Crystal Chemistry;
- Phase transformations;
- High Pressure-High Temperature Research
EXAFS and XANES are applied to the study of semiconductor-metal transitions of tetrahedrally bonded crystals under high pressure. When the variation of single-bond length is to be determined, EXAFS data can be easily and conveniently analyzed by a phase difference method. For more general cases, EXAFS data can be analyzed by a curve fitting method. With both methods, the accuracy of the estimated bond length is 0.01 A and that of the coordination number is 0.2. Calculations based on full multiple scattering theory show that the XANES spectrum is quite sensitive to the arrangements and electronic states of the atoms surrounding the absorbing atom. It is shown that EXAFS is a powerful tool for analyzing structural parameters under pressure, and that XANES is potentially useful for stodying structural and electronic states of a material under pressure.