The Complexity of the Continental Lower Crust and Moho from Pmp Data: Results from Cocrust Experiments

  1. Robert F. Mereu,
  2. Stephan Mueller and
  3. David M. Fountain
  1. R. F. Mereu,
  2. J. Baerg and
  3. J. Wu

Published Online: 9 APR 2013

DOI: 10.1029/GM051p0103

Properties and Processes of Earth's Lower Crust

Properties and Processes of Earth's Lower Crust

How to Cite

Mereu, R. F., Baerg, J. and Wu, J. (1989) The Complexity of the Continental Lower Crust and Moho from Pmp Data: Results from Cocrust Experiments, in Properties and Processes of Earth's Lower Crust (eds R. F. Mereu, S. Mueller and D. M. Fountain), American Geophysical Union, Washington, D. C.. doi: 10.1029/GM051p0103

Author Information

  1. Department of Geophysics, University of Western Ontario, London, Ontario, Canada N6a 5B7

Publication History

  1. Published Online: 9 APR 2013
  2. Published Print: 1 JAN 1989

ISBN Information

Print ISBN: 9780875904566

Online ISBN: 9781118666388

SEARCH

Options for accessing this content:

  • If you have access to this content through a society membership, please first log in to your society website.
  • Login via other institutional login options http://onlinelibrary.wiley.com/login-options.
  • You can purchase online access to this Chapter for a 24-hour period (price varies by title)
    • If you already have a Wiley Online Library or Wiley InterScience user account: login above and proceed to purchase the article.
    • New Users: Please register, then proceed to purchase the article.

Type your institution's name in the box below. If your institution is a Wiley customer, it will appear in the list of suggested institutions and you will be able to log in to access content. Some users may also log in directly via OpenAthens.

Please note that there are currently a number of duplicate entries in the list of institutions. We are actively working on fixing this issue and apologize for any inconvenience caused.

Please register to:

  • Save publications, articles and searches
  • Get email alerts
  • Get all the benefits mentioned below!

Register now >