Half plane edge diffraction


  • T. B. A. Senior


The concept of nonmetallic, resistive, and “conductive” sheets is discussed, and for a plane electromagnetic wave incident on a half plane composed of any one of these materials, the exact solution of the boundary value problem is obtained for incidence in a plane perpendicular to the edge. In each case the edge diffraction coefficient is proportional to a product of split functions arising from the Wiener-Hopf method of solution. Since each function depends on only one angular variable, the coefficient for arbitrary directions of incidence and observation is expressible in terms of the backscattering coefficient for edge-on incidence on a half plane with an equivalent impedance. This last is rather easily computed, and data are presented to illustrate the scattering behavior.