High-frequency scattering by a thin material half plane and strip

Diffraction coefficients are derived for a thin dielectric half plane and strip having arbitrary permittivity and permeability. This is accomplished by modeling the thin material layer by a pair of modified resistive and conductive sheets. By means of this model the dielectric half plane is first treated via the dual integral equation approach. By employing the half plane solution, up to third-order multiply diffracted fields are then derived for the case of a strip. These are obtained via the extended spectral ray method and include the surface wave diffraction effects in a uniform manner. Numerical results are also presented which validate the accuracy of the model and that of the derived diffraction coefficients.