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Chapter

Chapter 2.5 Energy-dispersive techniques

  1. B. Buras3,
  2. W. I. F. David2,
  3. L. Gerward3,
  4. J. D. Jorgensen4,
  5. B. T. M. Willis5

Published Online: 1 JAN 2006

DOI: 10.1107/97809553602060000580

Book Title

International Tables for Crystallography

International Tables for Crystallography

Additional Information

How to Cite

Buras, B., David, W. I. F., Gerward, L., Jorgensen, J. D. and Willis, B. T. M. 2006. Energy-dispersive techniques. International Tables for Crystallography. C:84–88.

Author Information

  1. 2

    ISIS Science Division, Rutherford Appleton Laboratory, Chilton, Didcot, Oxfordshire OX11 0QX, England

  2. 3

    Physics Department, Technical University of Denmark, DK-2800 Lyngby, Denmark

  3. 4

    Materials Science Division, Building 223, Argonne National Laboratory, Argonne, IL 60439, USA

  4. 5

    Chemical Crystallography Laboratory, University of Oxford, 9 Parks Road, Oxford OX1 3PD, England

Publication History

  1. Published Online: 1 JAN 2006

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In the first part of this chapter the principles of the white-beam, energy-dispersive method for X-ray diffraction are described with special emphasis on the use of synchrotron radiation. Expressions are given for the integrated intensity, the polarization factor and other correction factors. Applications in high-pressure X-ray diffraction are mentioned. In the second part of the chapter, neutron single-crystal Laue diffraction and neutron time-of-flight powder diffraction are discussed.

Keywords: energy-dispersive techniques; integrated intensity; Laue diffraction; neutron diffraction; refinement; resolution; Rietveld method; time-of-flight neutron diffraction; white-beam neutron diffraction; X-ray energy-dispersive diffraction; XED

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