Chapter 3.5 Preparation of specimens for electron diffraction and electron microscopy

Mathematical, physical and chemical tables

First Online Edition (2006)

Part 3. Preparation and examination of specimens

  1. N. J. Tighe1,
  2. J. R. Fryer2,
  3. H. M. Flower3

Published Online: 1 JAN 2006

DOI: 10.1107/97809553602060000589

International Tables for Crystallography

International Tables for Crystallography

How to Cite

Tighe, N. J., Fryer, J. R. and Flower, H. M. 2006. Preparation of specimens for electron diffraction and electron microscopy. International Tables for Crystallography. C:3:3.5:171–176.

Author Information

  1. 1

    42 Lema Lane, Palm Coast, FL 32137-2417, USA

  2. 2

    Department of Chemistry, University of Glasgow, Glasgow G12 8QQ, Scotland

  3. 3

    Department of Metallurgy, Imperial College, London SW7, England

Publication History

  1. Published Online: 1 JAN 2006


This chapter describes the preparation of specimens for electron diffraction and electron microscopy. The techniques used are different for ceramics and rock minerals, for metals, and for polymers and organic substances. Topics covered include: thin-section preparation, argon-ion etching; chemical etching; evaporated and sputtered thin films; chemical and electrochemical thinning solutions; cast films; sublimed films; and oriented solidification.


  • cast films;
  • ceramics;
  • chemical etching;
  • electrochemical thinning;
  • evaporated thin films;
  • ion-beam thinning;
  • metals;
  • organic compounds;
  • oriented solidification;
  • polishing;
  • polymers;
  • rock minerals;
  • preparation of specimens;
  • sputtered thin films;
  • sublimed films;
  • thin films and thinning;
  • thin sections;
  • thinning solutions