Chapter

Chapter 8.6 The Rietveld method

Mathematical, physical and chemical tables

First Online Edition (2006)

Part 8. Refinement of structural parameters

  1. A. Albinati1,
  2. B. T. M. Willis2

Published Online: 1 JAN 2006

DOI: 10.1107/97809553602060000614

International Tables for Crystallography

International Tables for Crystallography

How to Cite

Albinati, A. and Willis, B. T. M. 2006. The Rietveld method. International Tables for Crystallography. C:8:8.6:710–712.

Author Information

  1. 1

    Istituto Chimica Farmaceutica, Università di Milano, Viale Abruzzi 42, Milano 20131, Italy

  2. 2

    Chemical Crystallography Laboratory, University of Oxford, 9 Parks Road, Oxford OX1 3PD, England

Publication History

  1. Published Online: 1 JAN 2006

Abstract

An overview of the Rietveld method of analysing powder diffraction data, in which the crystal structure is refined by fitting the entire profile of the diffraction pattern to a calculated profile, is provided. The basic theory of Rietveld refinement is described and some problems that may lead to failure of the method are discussed.

Keywords:

  • peak-shape function;
  • preferred orientation;
  • Rietveld method;
  • statistical validity;
  • thermal diffuse scattering