Chapter

Chapter 8.8 Accurate structure-factor determination with electron diffraction

Mathematical, physical and chemical tables

First Online Edition (2006)

Part 8. Refinement of structural parameters

  1. J. Gjønnes

Published Online: 1 JAN 2006

DOI: 10.1107/97809553602060000616

International Tables for Crystallography

International Tables for Crystallography

How to Cite

Gjønnes, J. 2006. Accurate structure-factor determination with electron diffraction. International Tables for Crystallography. C:8:8.8:735–743.

Author Information

  1. Department of Physics, University of Oslo, PO Box 1048, Blindern, N-0316 Oslo, Norway

Publication History

  1. Published Online: 1 JAN 2006

Abstract

Techniques for accurate structure-factor determination with electron diffraction are discussed. Topics covered include: the systematic row method; three- and four-beam nonsystematic cases; zone-axis convergent-beam electron diffraction; the critical voltage and intersecting-Kikuchi-line method; phases and absorption in multiple-beam cases; and thickness fringes.

Keywords:

  • Bethe approximation;
  • Bloch-wave method;
  • convergent-beam electron diffraction;
  • critical-voltage effect;
  • Debye–Waller factors;
  • dispersion surfaces;
  • electron diffraction;
  • extinction distance;
  • Fourier potentials;
  • Intersecting-Kikuchi-line method;
  • Kikuchi patterns;
  • Kossel patterns;
  • Schrödinger wave equation;
  • structure factors;
  • Thickness fringes