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Resonant X-ray scattering studies of epitaxial complex oxide thin films
DOI: 10.1107/S0021889812047620
© Edith Perret et al. 2013
Additional Information
How to Cite
Perret, E., Park, C., Fong, D. D., Chang, K.-C., Ingram, B. J., Eastman, J. A., Baldo, P. M. and Fuoss, P. H. (2013), Resonant X-ray scattering studies of epitaxial complex oxide thin films. J. Appl. Cryst., 46: 76–87. doi: 10.1107/S0021889812047620
Keywords:
- resonant anomalous X-ray reflectivity;
- complex oxides;
- thin films;
- elemental distribution profiles;
- characterization of buried interfaces
Resonant anomalous X-ray reflectivity (RAXR) is a powerful technique for measuring element-specific distribution profiles across surfaces and buried interfaces. Here, the RAXR technique is applied to characterize a complex oxide heterostructure, La0.6Sr0.4Co0.2Fe0.8O3−δ, on NdGaO3, and the effects of data sampling and model-dependent fitting procedures on the extracted elemental distribution profile are evaluated. The strontium profile through a 3.5 nm-thick film at 973 K and at an oxygen partial pressure of 150 Torr (1 Torr = 133.32 Pa) was determined from the measured RAXR spectra. The results demonstrate that in situ RAXR measurements can provide key insights into temperature- and environment-dependent elemental segregation processes, relevant, for example, in assessing the cathode performance of solid oxide fuel cells.