Scherrer after sixty years: A survey and some new results in the determination of crystallite size
Journal of Applied Crystallography
Volume 11, Issue 2, pages 102–113, April 1978
How to Cite
Langford, J. I. and Wilson, A. J. C. (1978), Scherrer after sixty years: A survey and some new results in the determination of crystallite size. Jnl Applied Crystallography, 11: 102–113. doi: 10.1107/S0021889878012844
- Cited By
Existing knowledge about Scherrer constants is reviewed and a summary is given of the interpretation of the broadening arising from small crystallites. Early work involving the half-width as a measure of breadth has been completed and Scherrer constants of simple regular shapes have been determined for all low-angle reflections (h2 + k2 + l2≤ 100) for four measures of breadth. The systematic variation of Scherrer constant with hkl is discussed and a convenient representation in the form of contour maps is applied to simple shapes. The relation between the `apparent' crystallite size, as determined by X-ray methods, and the `true' size is considered for crystallites having the same shape. If they are of the same size, then the normal Scherrer constant applies, but if there is a distribution of sizes, a modified Scherrer constant must be used.