A new single-crystal mounting technique for low-background high-temperature X-ray diffraction
Journal of Applied Crystallography
Volume 30, Issue 6, pages 1162–1164, December 1997
How to Cite
Schreuer, J., Baumgarte, A. and Steurer, W. (1997), A new single-crystal mounting technique for low-background high-temperature X-ray diffraction. Jnl Applied Crystallography, 30: 1162–1164. doi: 10.1107/S0021889897003142
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A new single-crystal mounting technique for high-temperature X-ray diffraction up to 1700 K on an imaging plate scanner has been developed. The crystal is clamped mechanically by three to six very thin alumina fibres. Besides the cheap and easy manufacturing procedure, its major advantage is the resultant very low background; it consists mainly of weak, smooth Debye–Scherrer rings which can be easily removed by image-processing methods.