? Kabsch 2010
Acta Crystallographica Section D
Volume 66, Issue 2, pages 125–132, February 2010
How to Cite
Kabsch, W. (2010), XDS. Acta Crystallographica Section D, 66: 125–132. doi: 10.1107/S0907444909047337
The usage and control of recent modifications of the program package XDS for the processing of rotation images are described in the context of previous versions. New features include automatic determination of spot size and reflecting range and recognition and assignment of crystal symmetry. Moreover, the limitations of earlier package versions on the number of correction/scaling factors and the representation of pixel contents have been removed. Large program parts have been restructured for parallel processing so that the quality and completeness of collected data can be assessed soon after measurement.