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New developments in fabrication of high-energy-resolution analyzers for inelastic X-ray spectroscopy
DOI: 10.1107/S0909049511001828
International Union of Crystallography, 2011
Additional Information
How to Cite
Said, A. H., Sinn, H. and Divan, R. (2011), New developments in fabrication of high-energy-resolution analyzers for inelastic X-ray spectroscopy. J. Synchrotron Rad., 18: 492–496. doi: 10.1107/S0909049511001828
Keywords:
- high-energy-resolution analyzers;
- inelastic X-ray scattering spectroscopy
In this work new improvements related to the fabrication of spherical bent analyzers for 1 meV energy-resolution inelastic X-ray scattering spectroscopy are presented. The new method includes the use of a two-dimensional bender to achieve the required radius of curvature for X-ray analyzers. The advantage of this method is the ability to monitor the focus during bending, which leads to higher-efficiency analyzers.