Automatic XAFS measurement system developed at BL14B2 in SPring-8
International Union of Crystallography, 2012
Journal of Synchrotron Radiation
Volume 19, Issue 1, pages 54–59, January 2012
How to Cite
Oji, H., Taniguchi, Y., Hirayama, S., Ofuchi, H., Takagaki, M. and Honma, T. (2012), Automatic XAFS measurement system developed at BL14B2 in SPring-8. Jnl of Synchrotron Radiation, 19: 54–59. doi: 10.1107/S0909049511042518
A novel XAFS measurement system has been developed in which XAFS measurements can be performed including sample-loading and detector adjustments. With this system, XAFS measurements of up to 80 samples in both transmission and fluorescence modes can be carried out. The adjustment of the optical components has also been automated. It not only saves manpower and measurement time, but also improves the accuracy and reliability of sample alignments.