A Bayesian Goodness of Fit Test and Semiparametric Generalization of Logistic Regression with Measurement Data
Version of Record online: 14 MAR 2013
© 2013, The International Biometric Society
Volume 69, Issue 2, pages 508–519, June 2013
How to Cite
Schörgendorfer, A., Branscum, A. J. and Hanson, T. E. (2013), A Bayesian Goodness of Fit Test and Semiparametric Generalization of Logistic Regression with Measurement Data. Biometrics, 69: 508–519. doi: 10.1111/biom.12007
- Issue online: 25 JUN 2013
- Version of Record online: 14 MAR 2013
- Manuscript Accepted: 1 NOV 2012
- Manuscript Revised: 1 OCT 2012
- Manuscript Received: 1 FEB 2012
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