Probability-enhanced sufficient dimension reduction for binary classification
Version of Record online: 29 APR 2014
© 2014, The International Biometric Society
Volume 70, Issue 3, pages 546–555, September 2014
How to Cite
Shin, S. J., Wu, Y., Zhang, H. H. and Liu, Y. (2014), Probability-enhanced sufficient dimension reduction for binary classification. Biometrics, 70: 546–555. doi: 10.1111/biom.12174
- Issue online: 22 SEP 2014
- Version of Record online: 29 APR 2014
- Manuscript Accepted: 1 MAR 2014
- Manuscript Revised: 1 FEB 2014
- Manuscript Received: 1 FEB 2013
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