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A Metrological Study of the Shear Difference Technique in Photoelasticity

Authors

  • M. Solaguren-Beascoa Fernández

    Corresponding author
    1. Structural Integrity Group, Escuela Politécnica Superior, Universidad de Burgos, Burgos, Spain
    • Correspondence

      M. Solaguren-Beascoa Fernández,

      Structural Integrity Group, Escuela Politécnica Superior,

      Universidad de Burgos,

      Avda. de Cantabria s/n,

      09006 Burgos,

      Spain

      Email: msolaguren@ubu.es

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Abstract

In this paper, the shear difference technique is studied from the metrological point of view of measurement uncertainty. Errors committed in the numerical integration of equilibrium equation are bounded and the Monte Carlo method (MCM) for uncertainty evaluation is applied. The influence of the number of points along the integration line on accuracy is studied. It is shown that the accuracy of this technique improves if the number of points along integration line is optimized. In addition, the conventional method and Tesar's improvement are compared from this metrological point of view. Despite its smaller Taylor's residuum, the method of Tesar does not give higher accuracy.

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